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Estimation of defective element search duration in electronic systems by means of diagnostic complex “MARS”

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Category: Information technologies, systems analysis and administration

Last Updated on 16 May 2013

Published on 15 November 2012

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Authors:

G.G. Sergeyev, Cand. Sci. (Tech.), Associate Professor, State Higher Educational Institution “Sevastopol National Technical University”, Senior Lecturer of the Department of Cybernetics and Computing Techniques, Sevastopol, Ukraine

Abstract:

Purpose. To analyze the new technique of estimation of malfunction unit localization process duration in radio-electronic equipment. It will allow assessing of admissible limits of time spend on repair.

Methodology. The hardware-software system “MARS” designed by NTP “Ukraviazakaz” (Kyiv city) was considered as basic means of diagnostics. The problem urgency in general has been put and earlier publications covering the problem have been considered.

Findings. The fact that the time spent on the localization of a malfunctioning unit is an additive function of tree determinants. The first is load time of test file from database to memory of computer. The second is time of start run of standard substitute element required to put it into operating mode. The third is time spent on taking off data from oscillograph, modeling and analyzing. The load time of test file and modeling and analyzing time are stochastic parameters. The experiments have showed that it is feasible to forecast the repair time with acceptable accuracy.

Originality. The new method of estimation of time required for electronics malfunctioning units localization and repair by means of the hardware-software system “MARS” has been offered.

Practical value. The accurate forecasting of time required for diagnostics allows grounding of performance standards determined for repair workers and cost of their work.

References:

1. Сергеев Г.Г. МАРС – новый комплекс для диагностики и ремонта радиоэлектронного оборудования ВСВСУ / Сергеев Г.Г., Иванов В.М. // Сьома наукова конференція „Новітні технології – для захисту повітряного простору“. – Харків: ХУПС, 2011. –79 с.

Sergeyev, G.G. and Ivanov, V.M. (2011), “The new complex for repair and diagnostic of electronic equipment “MARS” // Proc. Of the 7th Scientific Conference “New technologies for air space protection”, Kharkiv.

2. Медведев А.М. Сборка и монтаж электронных устройств. / Медведев А.М. – М.: Техносфера, 2007.

Medvedev, A.M. (2007), Sborka i montazh elektronnykh ustroistv [Assemblage and Installation of Electronic Devices], Technosfera, Moscow, Russia.

3. Гафт С. Стратегия контроля качества при переходе к бессвинцовым технологиям. / Гафт С., Матов Е. – Электроника НТБ. – 2005. – №5, С. 24–27..

Gaft, S. and Matov, Ye. (2005), “Quality assurance strategy at transition to lead-free technologies”, NTB Electronika, no.5. pp. 24–27.

4. Насонов А. Электрическое тестирование изделий высокой надёжности / Насонов А. // Печатный монтаж. – 2008. – № 5. – С. 32–34.

Nasonov, A. (2008), “Electric testing of products of high reliability”, Pechatnyi montazh, no.5, pp. 32–34.

5. Сергеев Г.Г. Оптимизация процесса поиска причины отказа РЭА в условиях дефицита информации / Г.Г. Сергеев, А.Л. Овчинников // Информационные технологии и компьютерная инженерия. – Винница: Изд-во ВНТУ, 2007. – №3(10) С. 45–49.

Sergeyev, G.G. and Ovchinnikov, A.L. (2007), “The optimization of the search process of a radio-electronic equipment failure in conditions of deficiency of the information”, Information technology and computer engineering, no.3(10), pp. 45–49.

6. Сергеев Г.Г. Новый подход к реализации программной системы единовременного тестирования дискретных и аналоговых устройств / Сергеев Г.Г. // Вимірювальна та обчислювальна техніка в технологічних процесах. – Хмельницький, 2007.–№1. С. 60–63

Sergeyev, G.G. (2007), “New realization of program system of discrete and analog devices testing”, Measuring and computer facilities in technological processes, no.3(10), pp. 60–63.

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