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Automated system of scanning the surface potential

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Category: Geotechnical and mining mechanical engineering, machine building

Last Updated on 16 March 2017

Published on 16 March 2017

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Authors:

O.V.Vasylenko, Cand. Sc. (Tech.), Assoc. Prof.,Zaporizhzhya National Technical University, Zaporizhzhya, Ukraine, e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.

Ye.L.Zhavzharov, Cand. Sc. (Phys.-Math.), Assoc. Prof.,Zaporizhzhya National Technical University, Zaporizhzhya, Ukraine, e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.

Abstract:

Purpose.Development of an automated system of scanning the surface potential by criteria of efficiency, universality, adaptability, accuracy and speed.

Methodology.The structural and parametric optimization of the system was performed by using multivariate analysis at the macro-level by the tools of behavioral simulation in Micro-Cap 11 program, according to the principles of research of multi-domain systems in Automatic Control Theory.

Findings.Due to three stepper motors, controlled by the microcontrollers, this system allows one to fully automate the surface scanning process, improve the accuracy and speed measuring a contact potential difference on the basis of Kelvin method. A number of new models for virtual experiment at macro-level in ECAD applications have been developed. A prototype system has been designed and experiments with different materials, coatings and films have been conducted.

Originality.New models of elements for automatic control systems which are relevant to the criteria of adequacy and efficiency and are supplemental to ECAD software for analyzing mechatronic systems have been developed.

Practical value.Compared with prototypes, these systems have distinctive features such as low cost, full automation of scan, variation of scale and the number of steps, as well as automatic compensation of potential difference. Due to the full automation, the proposed system increases the possibility to analyze the structural, electrical and physical state of surface of different materials, while its low cost and adaptability expands its possible application for the educational process. Models of Control System elements have been installed in the ECAD library and are available now for using in analysis of mechatronic systems.

References/Списоклітератури

1.Panteleev, K.V., Svistun, A.I. and Zharin, A.L., 2014. Methods of measurement of the electron work function to monitor the status of surfaces under friction. Priboryimetodyizmerenii,No. 2, pp. 107–112.

Пантелеев К.В. Методы измерений работы выхода электрона для контроля состояния поверхностей в процессе трения / К.В.Пантелеев, А.И.Свистун, А.Л.Жарин; Приборы и методы измерений – 2014. – № 2. – С. 107–112.

2.Laurent, Nony. 2013. Principles of Kelvin Probe Force Microscopy and applications. [online] Marseille, France. Available at: https://cel.archives-ouvertes.fr/cel-00917935/document.

3.Zhavzharov, I.L., Nagorna, N.M. and Smyrnova, N.A., Zaporizhzhya National Technical University, 2006. The device for automatic measurement of potential difference by contactless method. Ukraine. Pat. 104591.

Патент. 104591 Україна, МПК G01R 29/12 (2006.01), G01N 27/87 (2006.01). Пристрій для автоматизованого вимірювання контактної різниці потенціалів безконтактним методом / Жавжаров Є.Л., Нагорна Н.М., Смирнова Н.А.; власник Запорізький національний технічний університет. — № u201507171; дата заявки 17.07.2015; дата публік. 10.02.2016, Бюл. № 3, 2016.

4.Kompaniiets, I.V., Shkilko, A.M. and Borysov, V.V. Ukrainian Engineering and Pedagogical Academy, 2009. Device for measuring the surface potential. Ukraine. Pat. 39395.

Патент. 39395 Україна, МПК G01R 29/12. Пристрій для вимірювання поверхневого потенціалу / Компанієць І.В., Шкілько А.М., Борисов В.В.; власник Українська інженерно-педагогічна академія. — № u200811428; дата заявки 22.09.2009; дата публік. 25.02.2009, Бюл. № 4.

5.Zharin, A., 2010. Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping. In: B.Bhushan, ed. 2010. Scanning Probe Microscopy in Nanoscience and Nanotechnology. Springer Berlin Heidelberg. DOI: 10.1007/978-3-642-03535-7_19

6.Kompaniiets, I.V. and Shkilko, A.M., 2010. Metrological maintenance of the meter contact potential difference. Visnyk Natsionalnoho Tekhnichnoho Universytetu “KhPI”, Special issue: “New solutions in modern technologies”, No. 57, pp. 150–153.

Компанеец И.В. Метрологическое обеспечение измерителя контактной разности потенциалов / И.В.Компанеец, А.М.Шкилько; Вестник Нац. техн. ун-та “ХПИ”: сб. науч. трудов, темат. вип.: “Новые решения в современных технологиях”. – 2010. – № 57, – С. 150–153.

7.Vasylenko, O.V., 2015. Analysis of programs for mechatronic systems modeling. Radioelektronika, informatika, upravlenie. No. 2, pp. 16–31.

Василенко О.В. Аналіз програм для моделю­вання мехатронних систем / О.В.Василенко; Радиоэлектроника, информатика, управление. – 2015. – № 2. – С. 16–31.

8.Micro-Cap 11 Electronic Circuit Analysis Program. User’s Guide. © Spectrum Software. 1982–2014. [online] Available at: http://www.spectrum-soft.com/down/ug11.pdf

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